Newsgroups: sci.image.processing
Path: cantaloupe.srv.cs.cmu.edu!rochester!udel!gatech!newsxfer.itd.umich.edu!csd475b!news
From: Ron Swonger <cswonger@erim.org>
Subject: 3-D micron-level surface or sample mensuration
Message-ID: <1995Jul31.124602.2578@newsspool.erim.org>
Sender: news@newsspool.erim.org
Organization: Environmental Research Institute of Michigan (ERIM)
Date: Mon, 31 Jul 95 12:46:02 GMT
Lines: 16

Do you have, or do you know someone who has, a need for the
high-volume capture of 3-D measurements of surfaces or objects or
material samples in which:
	1. 3-D (range) measurement accuracy in the micron range
		 is desired,
	2. The area occupied by the surface to be measured may be
		 as large as several square feet,
	3. Tens of thousands of point measurements need to be made
		 in a very few seconds, and
	4. It may also be desirable to stand off from the surface
		 being measured by as much as several feet.
I would like to hear from anyone who knows of an application that
roughly fits the above description, since we have technology that
is aimed at such use. Please contact me directly at cswonger@erim.org
or at (313) 994-1200 Extension 2450.
			Ron Swonger, ERIM      
